TC Data-Driven Control and Monitoring
Welcome to the IEEE-IES Technical Committee on Data-Driven Control and Monitoring (TC-DDCM) website!
This committee aims to provide a forum for researchers and practitioners to exchange their latest achievements and to identify critical issues and challenges for future investigation on control, monitoring, fault diagnosis and optimization with complex industrial applications.
In this web site you can find information about the activities undertaken by the Technical Committee. If you wish to be involved in these activities, join the TC-DDCM.
To keep up to date with the TC Data-Driven Control and Monitoring upcoming activities and subscribe to the TC-DDCM mailing list.